In situ x-ray diffraction study of Ni-Yb interlayer and alloy systems on Si(100)
- W. Knaepen
- J. Demeulemeester
- et al.
- 2009
- JVSTA
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153 results for Jean L. Jordan-Sweet
Phase transitions in Ge-Te phase change materials studied by time-resolved x-ray diffraction
- Simone Raoux
- Becky Mun̈oz
- et al.
- 2009
- Applied Physics Letters
In situ study of the formation of silicide phases in amorphous Ni-Si mixed layers
- C. Van Bockstael
- C. Detavernier
- et al.
- 2009
- Journal of Applied Physics
Method to measure the viscosity of nanometer liquid films from the surface fluctuations
- Zhaohui Yang
- Chi-Hang Lam
- et al.
- 2009
- Applied Physics Letters
Annealing behavior of atomic layer deposited HfO2 films studied by synchrotron x-ray reflectivity and grazing incidence small angle scattering
- M.L. Green
- A.J. Allen
- et al.
- 2009
- Journal of Applied Physics
Influence of interfaces and doping on the crystallization temperature of Ge-Sb
- Simone Raoux
- Huai-Yu Cheng
- et al.
- 2009
- Applied Physics Letters
In situ x-ray diffraction study of metal induced crystallization of amorphous germanium
- W. Knaepen
- S. Gaudet
- et al.
- 2009
- Journal of Applied Physics
Crystallization characteristics of Ge-Sb phase change materials
- Simone Raoux
- Cyril Cabrai Jr.
- et al.
- 2009
- MRS Spring Meeting 2009
The influence of nitrogen doping on the chemical and local bonding environment of amorphous and crystalline Ge2Sb2Te 5
- J.S. Washington
- E. Joseph
- et al.
- 2009
- MRS Spring Meeting 2009
Stress gradients observed in Cu thin films induced by capping layers
- Conal E. Murray
- Paul R. Besser
- et al.
- 2009
- MRS Spring Meeting 2009