Atomic flux divergence based current conversion scheme for signal line electromigration reliability assessment
- Zhong Guan
- Malgorzata Marek-Sadowska
- et al.
- 2014
- IITC/AMC 2014
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.