A simple in situ method to detect graphene formation at SiC surfaces
- Satoshi Oida
- James B. Hannon
- et al.
- 2011
- Applied Physics Letters
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228 results for Rudolf M. Tromp
Low energy electron microscopy imaging using Medipix2 detector
- I. Sikharulidze
- R. Van Gastel
- et al.
- 2011
- Nucl. Instrum. Methods Phys. Res
Medium energy ion scattering of Gr on SiC(0001) and Si(100)
- Matthew Copel
- Satoshi Oida
- et al.
- 2011
- Applied Physics Letters
Measuring and correcting aberrations of a cathode objective lens
- Rudolf M. Tromp
- 2011
- Ultramicroscopy
Decoupling graphene from SiC(0001) via oxidation
- Satoshi Oida
- Fenton R. McFeely
- et al.
- 2010
- Physical Review B - CMMP
A new aberration-corrected, energy-filtered LEEM/PEEM instrument. I. Principles and design
- R.M. Tromp
- James B. Hannon
- et al.
- 2010
- Ultramicroscopy
A simple energy filter for low energy electron microscopy/photoelectron emission microscopy instruments
- R.M. Tromp
- Y. Fujikawa
- et al.
- 2009
- Journal of Physics Condensed Matter
Micrometer-scale band mapping of single silver islands in real and reciprocal space
- Y. Fujikawa
- T. Sakurai
- et al.
- 2009
- Physical Review B - CMMP
Medipix 2 detector applied to low energy electron microscopy
- R. van Gastel
- I. Sikharulidze
- et al.
- 2009
- Ultramicroscopy
Pit formation during graphene synthesis on SiC(0001): In situ electron microscopy
- J.B. Hannon
- R.M. Tromp
- 2008
- Physical Review B - CMMP