Imaging moiré deformation and dynamics in twisted bilayer graphene
- Tobias A. de Jong
- Tjerk Benschop
- et al.
- 2022
- Nature Communications
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228 results for Rudolf M. Tromp
Low-Energy Electron Irradiation Damage in Few-Monolayer Pentacene Films
- A. Tebyani
- F.B. Baalbergen
- et al.
- 2021
- Journal of Physical Chemistry C
Optical Near-Field Electron Microscopy
- Raphaël Marchand
- Radek Šachl
- et al.
- 2021
- Physical Review Applied
Complementary LEEM and eV-TEM for imaging and spectroscopy
- Peter S. Neu
- Daniël Geelen
- et al.
- 2021
- Ultramicroscopy
Aberration corrected spin polarized low energy electron microscope
- Lei Yu
- Weishi Wan
- et al.
- 2020
- Ultramicroscopy
Quantitative analysis of spectroscopic low energy electron microscopy data: High-dynamic range imaging, drift correction and cluster analysis
- T. A. de Jong
- D. N.L. Kok
- et al.
- 2020
- Ultramicroscopy
Key Role of Very Low Energy Electrons in Tin-Based Molecular Resists for Extreme Ultraviolet Nanolithography
- Ivan Bespalov
- Yu Zhang
- et al.
- 2020
- ACS AMI
Near-Surface Damage and Contamination after CF4/H2 Reactive Ion Etching of Si
- G.S. Oehrlein
- R.M. Tromp
- et al.
- 2019
- JES
Nonuniversal Transverse Electron Mean Free Path through Few-layer Graphene
- Daniël Geelen
- J. Jobst
- et al.
- 2019
- Physical Review Letters
Quantifying work function differences using low-energy electron microscopy: The case of mixed-terminated strontium titanate
- J. Jobst
- Laurens M. Boers
- et al.
- 2019
- Ultramicroscopy