Measuring chromatic aberration in LEEM/PEEM
- Rudolf M. Tromp
- 2019
- Ultramicroscopy
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228 results for Rudolf M. Tromp
Intrinsic stacking domains in graphene on silicon carbide: A pathway for intercalation
- T. A. de Jong
- E. E. Krasovskii
- et al.
- 2018
- Physical Review Materials
Electrical transport across grain boundaries in graphene monolayers on SiC(0001)
- Xiaodong Zhou
- Shuai-Hua Ji
- et al.
- 2018
- 2D Materials
Charge Catastrophe and Dielectric Breakdown during Exposure of Organic Thin Films to Low-Energy Electron Radiation
- A. Thete
- Daniël Geelen
- et al.
- 2017
- Physical Review Letters
Reprint of Low-energy electron potentiometry
- J. Jobst
- Jaap Kautz
- et al.
- 2017
- Ultramicroscopy
Space charge effects and aberrations on electron pulse compression in a spherical electrostatic capacitor
- Lei Yu
- Haibo Li
- et al.
- 2017
- Ultramicroscopy
Defocus in cathode lens instruments
- Rudolf M. Tromp
- M.S. Altman
- 2017
- Ultramicroscopy
Low-energy electron potentiometry
- J. Jobst
- Jaap Kautz
- et al.
- 2017
- Ultramicroscopy
Design and commissioning of an aberration-corrected ultrafast spin-polarized low energy electron microscope with multiple electron sources
- Weishi Wan
- Lei Yu
- et al.
- 2017
- Ultramicroscopy
Quantifying electronic band interactions in van der Waals materials using angle-resolved reflected-electron spectroscopy
- J. Jobst
- A. J.H. van der Torren
- et al.
- 2016
- Nature Communications