Key Role of Very Low Energy Electrons in Tin-Based Molecular Resists for Extreme Ultraviolet Nanolithography
- Ivan Bespalov
- Yu Zhang
- et al.
- 2020
- ACS AMI
Publications
Date
Featured collections
Popular topics
31 results for Sense Jan van der Molen
Extracting transverse electron mean free paths in graphene at low energy
- Peter S. Neu
- Daniël Geelen
- et al.
- 2023
- Ultramicroscopy
Low energy electron microscopy at cryogenic temperatures
- Arash Tebyani
- Sebastian Schramm
- et al.
- 2023
- Ultramicroscopy
Back illuminated photo emission electron microscopy (BIPEEM)
- Amin Moradi
- Matthijs Rog
- et al.
- 2023
- Ultramicroscopy
Critical role of electronic states above the vacuum level in photoelectron and secondary electron emission in few-monolayer pentacene films
- Arash Tebyani
- Rudolf M. Tromp
- et al.
- 2023
- Physical Review B
Stacking domain morphology in epitaxial graphene on silicon carbide
- Tobias A. De Jong
- Luuk Visser
- et al.
- 2023
- Physical Review Materials
Low-energy electron microscopy contrast of stacking boundaries: Comparing twisted few-layer graphene and strained epitaxial graphene on silicon carbide
- Tobias A. De Jong
- Xingchen Chen
- et al.
- 2023
- Physical Review B
Electron transmission and mean free path in molybdenum disulfide at electron-volt energies
- Peter S. Neu
- Makars Šiškins
- et al.
- 2023
- Physical Review B
Optical Near-Field Electron Microscopy
- Raphaël Marchand
- Radek Šachl
- et al.
- 2021
- Physical Review Applied
Complementary LEEM and eV-TEM for imaging and spectroscopy
- Peter S. Neu
- Daniël Geelen
- et al.
- 2021
- Ultramicroscopy