Evaluation of 10-nm Bulk FinFET RF Performance - Conventional Versus NC-FinFET
- R. Singh
- K. Aditya
- et al.
- 2018
- IEEE Electron Device Letters
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This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.
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3 results for K. Aditya
7-nm Nanowire FET process variation modeling using industry standard BSIM-CMG model
- R. Singh
- K. Aditya
- et al.
- 2016
- ICEE 2016
Impact of gamma-ray radiation on DC and RF performance of 10-nm bulk n-channel FinFETs
- K. Aditya
- R. Singh
- et al.
- 2020
- IEEE T-DMR