Microstructure analysis of epitaxial BaTiO3 thin films on SrTiO3-buffered Si: Strain and dislocation density quantification using HRXRD methods
- A. Borzì
- S. Dolabella
- et al.
- 2020
- Materialia
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3 results for A. Neels
Low Temperature Epitaxial Barium Titanate Thin Film Growth in High Vacuum CVD
- Michael Reinke
- Yury Kuzminykh
- et al.
- 2017
- Advanced Materials Interfaces
Integration of GaAs on Ge/Si towers by MOVPE
- A.G. Taboada
- T. Kreiliger
- et al.
- 2013
- MRS Spring Meeting 2013