Enhancing interface quality by gate dielectric deposition on a nitrogen-conditioned 4H-SiC surface
- John Rozen
- Masahiro Nagano
- et al.
- 2012
- Journal of Materials Research
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.