A new aberration-corrected, energy-filtered LEEM/PEEM instrument II. Operation and results
- Rudolf M. Tromp
- James B. Hannon
- et al.
- 2013
- Ultramicroscopy
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4 results for A. Berghaus
Low-energy electron microscopy and spectroscopy with ESCHER: Status and prospects
- S.M. Schramm
- J. Kautz
- et al.
- 2011
- IBM J. Res. Dev
A new aberration-corrected, energy-filtered LEEM/PEEM instrument. I. Principles and design
- R.M. Tromp
- James B. Hannon
- et al.
- 2010
- Ultramicroscopy
A simple energy filter for low energy electron microscopy/photoelectron emission microscopy instruments
- R.M. Tromp
- Y. Fujikawa
- et al.
- 2009
- Journal of Physics Condensed Matter