Simple Gate Metal Anneal (SIGMA) stack for FinFET Replacement Metal Gate toward 14nm and beyond
- Takashi Ando
- B. Kannan
- et al.
- 2014
- VLSI Technology 2014
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93 results for Richard Haight
Tunable electrical properties of TaNx thin films grown by ionized physical vapor deposition
- Miri Choi
- Catherine Dubourdieu
- et al.
- 2014
- JVSTB
Electronic and elemental properties of the Cu2ZnSn(S,Se) 4 surface and grain boundaries
- Richard Haight
- Xiaoyan Shao
- et al.
- 2014
- Applied Physics Letters
CdS and Cd-free buffer layers on solution phase grown Cu 2ZnSn(SxSe1- x)4 :Band alignments and electronic structure determined with femtosecond ultraviolet photoelectron spectroscopy
- Richard Haight
- Aaron Barkhouse
- et al.
- 2013
- MRS Fall Meeting 2013
Band alignment of SnS/Zn(O,S) heterojunctions in SnS thin film solar cells
- Leizhi Sun
- Richard Haight
- et al.
- 2013
- Applied Physics Letters
Cd-free buffer layer materials on Cu 2ZnSn(S xSe 1-x) 4: Band alignments with ZnO, ZnS, and In 2S 3
- D. Aaron R. Barkhouse
- Richard Haight
- et al.
- 2012
- Applied Physics Letters
Slurry-based processing of high-performance CZTSSe photovoltaic absorber layers
- David B. Mitzi
- Teodor K. Todorov
- et al.
- 2011
- ACS National Meeting 2011
Band alignment at the Cu2 ZnSn (SxSe1-x) 4 /CdS interface
- Richard Haight
- Aaron Barkhouse
- et al.
- 2011
- Applied Physics Letters
Temperature-dependent La- and Al-induced dipole behavior monitored by femtosecond pump/probe photoelectron spectroscopy
- Hiroaki Arimura
- Richard Haight
- et al.
- 2010
- Applied Physics Letters
Ultimate EOT scaling (< 5Å) using Hf-based high-κ gate dielectrics and impact on carrier mobility
- Takashi Ando
- Martin M. Frank
- et al.
- 2010
- ECS Transactions