PBTI/NBTI monitoring ring oscillator circuits with on-chip Vt characterization and high frequency AC stress capability
- Jae-Joon Kim
- Rahul M. Rao
- et al.
- 2011
- VLSI Circuits 2011
Publications
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.
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6 results for Amlan Ghosh
A centralized supply voltage and local body bias-based compensation approach to mitigate within-die process variation
- Amlan Ghosh
- Rahul M. Rao
- et al.
- 2009
- ISLPED 2009
A precise negative bias temperature instability sensor using slew-rate monitor circuitry
- Amlan Ghosh
- Richard B. Brown
- et al.
- 2009
- ISCAS 2009
On-chip process variation detection and compensation using delay and slew-rate monitoring circuits
- Amlan Ghosh
- Rahul M. Rao
- et al.
- 2008
- ISQED 2008
On-chip process variation detection using slew-rate monitoring circuit
- Amlan Ghosh
- Rahul M. Rao
- et al.
- 2008
- VLSID 2008
Slew-rate monitoring circuit for on-chip process variation detection
- Amlan Ghosh
- Rahul M. Rao
- et al.
- 2013
- IEEE Transactions on VLSI Systems