Use of performance path test to optimize yield
- Jeanne Paulette Bickford
- Jinjun Xiong
- 2013
- ASMC 2013
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3 results for Jeanne Paulette Bickford
Product yield prediction system and critical area database
- Thomas S. Barnett
- Jeanne Bickford
- et al.
- 2007
- ASMC 2007
Product yield prediction system and critical area database
- Thomas S. Barnett
- Jeanne P. Bickford
- et al.
- 2008
- IEEE Trans Semicond Manuf