B segregation to grain boundaries and diffusion in polycrystalline Si with flash annealing
- S. Jin
- K.S. Jones
- et al.
- 2012
- Journal of Applied Physics
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3 results for S. Jin
Pulsed-laser atom probe tomography of p-type field effect transistors on Si-on-insulator substrates
- S. Jin
- K.S. Jones
- et al.
- 2011
- Journal of Vacuum Science and Technology B
Dopant measurements in semiconductors with atom probe tomography
- P.A. Ronsheim
- M. Hatzistergos
- et al.
- 2010
- Journal of Vacuum Science and Technology B