Publications

This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.

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7 results for Michael Hatzistergos

Leakage and contact resistance reduction by diffusion of dopants in NiPt suicide
- - Ahmet Ozcan
  - Ming Cai
  - et al.
- 2011
- ADMETA 2011
High-κ/metal gate low power bulk technology - Performance evaluation of standard CMOS logic circuits, microprocessor critical path replicas, and SRAM for 45nm and beyond
- - D.-G. Park
  - K. Stein
  - et al.
- 2009
- VLSI-TSA 2009
Probing the interface barriers of dopant-segregated silicide-Si diodes with internal photoemission
- - Zhen Zhang
  - Joanna Atkin
  - et al.
- 2012
- IEEE T-ED
Pulsed-laser atom probe tomography of p-type field effect transistors on Si-on-insulator substrates
- - S. Jin
  - K.S. Jones
  - et al.
- 2011
- Journal of Vacuum Science and Technology B
SIMS quantification of SiGe composition with low-energy ion beams
- - Zhengmao Zhu
  - Paul Ronsheim
  - et al.
- 2011
- Surface and Interface Analysis
Dopant measurements in semiconductors with atom probe tomography
- - P.A. Ronsheim
  - M. Hatzistergos
  - et al.
- 2010
- Journal of Vacuum Science and Technology B
Impurity measurements in silicon with D-SIMS and atom probe tomography
- - P.A. Ronsheim
  - P. Flaitz
  - et al.
- 2008
- Applied Surface Science