Hardness assurance testing for proton direct ionization effects
- James R. Schwank
- Marty R. Shaneyfelt
- et al.
- 2012
- IEEE TNS
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3 results for Pascale M. Gouker
Comparison of single and two-photon absorption for laser characterization of single-event upsets in SOI SRAMs
- James R. Schwank
- Marty R. Shaneyfelt
- et al.
- 2011
- IEEE TNS
Hardness assurance testing for proton direct ionization effects
- James R. Schwank
- Marty R. Shaneyfelt
- et al.
- 2011
- RADECS 2011