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Engineering band-edge high-κ/metal gate n-MOSFETs with cap layers containing group IIA and IIIB elements by atomic layer depositionH. JagannathanL.F. Edgeet al.2009ECS Meeting 2009
Experimental and theoretical analysis of factors causing asymmetrical temperature dependence of vt in High-k Metal gate CMOS with capped High-k techniquesRyosuke IijimaMariko Takayanagi2008IEDM 2008
High-K gate dielectric structures by atomic layer deposition for the 32nm and beyond nodesR.D. ClarkS. Consiglioet al.2008ECS Meeting 2008
Higher hole mobility induced by twisted Direct Silicon Bonding (DSB)M. HamaguchiH. Yinet al.2008VLSI Technology 2008
High-performance high-κ/metal gates for 45nm CMOS and beyond with gate-first processingM. ChudzikB. Doriset al.2007VLSI Technology 2007