Scalability of Direct Silicon Bonded (DSB) technology for 32nm node and beyondHaizhou YinC.Y. Sunget al.2007VLSI Technology 2007
Extendibility of NiPt silicide contacts for CMOS technology demonstrated to the 22-nm nodeKazuya OhuchiChristian Lavoieet al.2007IEDM 2007
Challenge for high-k/metal gate CMOSFETs in 32 nm generation and beyondM. Takayanagi2007ECS Meeting 2007