Analysis of the effect of the gate oxide breakdown on SRAM stability
- R. Rodríguez
- J.H. Stathis
- et al.
- 2002
- Microelectronics Reliability
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22 results for K. Bernstein
CMOS circuit technology for sub-ambient temperature operation
- I. Aller
- K. Bernstein
- et al.
- 2000
- Digest of Technical Papers - IEEE International Solid-State Circuits Conference