Qualification, monitoring, and integration into a production environment of the world's first fully programmable illuminatorGregory McIntyreDaniel Corlisset al.2011SPIE Advanced Lithography 2011
Experimental result and simulation analysis for the use of pixelated illumination from source mask optimization for 22nm logic lithography processKafai LaiAlan E. Rosenbluthet al.2009SPIE Advanced Lithography 2009