One-dimensional thickness scaling study of phase change material (Ge 2Sb2Te5 using a pseudo 3-terminal device
- Sangbum Kim
- Byoung-Jae Bae
- et al.
- 2011
- IEEE T-ED
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.