Technology variability from a design perspective
- Borivoje Nikolić
- Ji-Hoon Park
- et al.
- 2011
- IEEE TCAS-I
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2 results for Kun Qian
Measurement and analysis of variability in 45 nm strained-Si CMOS technology
- Liang-Teck Pang
- Kun Qian
- et al.
- 2009
- IEEE Journal of Solid-State Circuits