Electron mobility in surface- and buried-channel flatband In 0.53Ga0.47As MOSFETs with ALD Al2O3 gate dielectric
- Steven J. Bentley
- Martin Holland
- et al.
- 2011
- IEEE Electron Device Letters
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5 results for Paul C. McIntyre
Structural, electronic, and dielectric properties of ultrathin zirconia films on silicon
- S. Sayan
- N.V. Nguyen
- et al.
- 2005
- Applied Physics Letters
Charge trapping studies on ultrathin ZrO 2 and HfO 2 high-k dielectrics grown by room temperature ultraviolet ozone oxidation
- Shriram Ramanathan
- Paul C. McIntyre
- et al.
- 2004
- Applied Physics Letters
Observation and modeling of the initial fast interdiffusion regime in Si/SiGe multilayers
- D.B. Aubertine
- M.A. Mander
- et al.
- 2002
- Journal of Applied Physics
Properties of ferroelectric films at small dimensions
- T.M. Shaw
- S. Trolier-McKinstry
- et al.
- 2000
- Annual Review of Materials Science