32nm general purpose bulk CMOS technology for high performance applications at low voltage
- F. Arnaud
- J. Liu
- et al.
- 2008
- IEDM 2008
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High-K gate stack breakdown statistics modeled by correlated interfacial layer and high-k breakdown path
- G. Ribes
- P. Mora
- et al.
- 2010
- IRPS 2010