Virtual metrology and run-to-run control in semiconductor manufacturing
- Yada Zhu
- Robert J. Baseman
- et al.
- 2012
- ISSAT-RQD 2012
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38 results for Emmanuel Yashchin
Min-log approach to modeling dielectric breakdown data
- Emmanuel Yashchin
- Baozhen Li
- et al.
- 2012
- IRPS 2012
Defining the controlling parameter in constrained discriminative linear transform for supervised speaker adaptation
- Danning Jiang
- Dimitri Kanevsky
- et al.
- 2011
- ICASSP 2011
Computational and Monte-Carlo aspects of systems for monitoring reliability data
- Emmanuel Yashchin
- 2010
- COMPSTAT 2010
Design and implementation of systems for monitoring lifetime data
- Emmanuel Yashchin
- 2010
- IWISQC 2010
Statistically regulating program behavior via mainstream computing
- Mark William Stephenson
- Ram Rangan
- et al.
- 2010
- CGO 2010
Modeling and forecasting of defect-limited yield in semiconductor manufacturing
- Michael Baron
- Asya Takken
- et al.
- 2008
- IEEE Trans Semicond Manuf
Accelerated Monte Carlo for Kullback-Leibler divergence between Gaussian mixture models
- Jia-Yu Chen
- John R. Hershey
- et al.
- 2008
- ICASSP 2008
Modeling of risk losses using size-biased data
- Emmanuel Yashchin
- 2007
- IBM J. Res. Dev
Cost (or price) forecasting in the face of technological advance
- David A. Harville
- Emmanuel Yashchin
- 2007
- JASA