Minimum void size and 3-parameter lognormal distribution for em failures in Cu interconnects
- Baozhen Li
- Cathryn Christiansen
- et al.
- 2006
- IRPS 2006
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38 results for Emmanuel Yashchin
Foreword: Special issue on statistics in quality and productivity
- Michael Baron
- Emmanuel Yashchin
- 2020
- Appl Stochastic Models Bus Indus
Foreword: Special issue on statistics in quality, industry, and technology
- Joanne Wendelberger
- Emmanuel Yashchin
- 2020
- Appl Stochastic Models Bus Indus
Gradient analysis of Markov-type control schemes and its applications
- Emmanuel Yashchin
- 2019
- Commun. Stat. Simul. Comput.
On detection of changes in categorical data
- Emmanuel Yashchin
- 2016
- Quality Technology and Quantitative Management
Discussion of recent advances in process monitoring: Nonparametric and variable-selection methods for phase i and phase II
- Emmanuel Yashchin
- 2014
- Quality Engineering
Parametric estimation for window censored recurrence data
- Yada Zhu
- Emmanuel Yashchin
- et al.
- 2014
- Technometrics
Selected topics in ultra-low emissivity alpha-particle detection
- Michael S. Gordon
- Kenneth P. Rodbell
- et al.
- 2013
- IEEE TNS
Modeling and forecasting of defect-limited yield in semiconductor manufacturing
- Michael Baron
- Asya Takken
- et al.
- 2008
- IEEE Trans Semicond Manuf
Modeling of risk losses using size-biased data
- Emmanuel Yashchin
- 2007
- IBM J. Res. Dev