Dependence of the Si-SiO2 barrier height on SiO2 thickness in MOS tunnel structures
- L. Kasprzak
- R.B. Laibowitz
- et al.
- 2008
- Journal of Applied Physics
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4 results for M. Ohring
Void formation and growth during electromigration in thin films
- R. Rosenberg
- M. Ohring
- 2003
- Journal of Applied Physics
A new experimental technique for studying mass transport in liquid metals
- I.Y. Khandros
- M. Ohring
- 1989
- Journal of Materials Science
Nucleation of small metal particles on ultrathin SiO2 films on Si
- L. Kasprzak
- R.B. Laibowitz
- et al.
- 1974
- Thin Solid Films