Electromigration in a two-level Al-Cu interconnection with W studs
- T. Kwok
- C. Tan
- et al.
- 1990
- VMIC 1990
Publications
Date
Featured collections
Popular topics
21 results for S. Basavaiah
Dry etching of TiN/Al(Cu)/Si for very large scale integrated local interconnections
- K.W. Choi
- N.J. Mazzeo
- et al.
- 1990
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Submicron high performance bipolar technology
- T.C. Chen
- J.D. Cressler
- et al.
- 1989
- VLSI Technology 1989
Effects of processing conditions on the characteristics of platinum silicide Schottky barrier diodes
- D. Moy
- S. Basavaiah
- et al.
- 1988
- Solid State Electronics
Properties of selective low pressure chemically vapor deposited tungsten films produced by hydrogen reduction in a cold wall system
- R.V. Joshi
- D.A. Smith
- et al.
- 1988
- Thin Solid Films
Sub-400-ps ISL circuits
- Ching-Te Chuang
- G.P. Li
- et al.
- 1986
- IEEE Electron Device Letters
A critical comparison of silicide film deposition techniques
- K.Y. Ahn
- S. Basavaiah
- 1984
- Thin Solid Films
High-Reliability Pb-Alloy Josephson Junctions for Integrated Circuits
- H.-C. Ward Huang
- Suryadevar Basavaiah
- et al.
- 1980
- IEEE T-ED
Automatic thermal cycling apparatus
- S. Basavaiah
- S.J. Singer
- 1978
- Cryogenics
Bistable Switching and Conduction Mechanisms in Nb-Nb2O5-Bi Junctions
- S. Basavaiah
- K.C. Park
- 1973
- IEEE T-ED