Acoustic-phonon runaway and impact ionization by hot electrons in silicon dioxide
- D. Arnold
- E. Cartier
- et al.
- 1992
- Physical Review B
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119 results for D.J. DiMaria
Identification of an interface defect generated by hot electrons in SiO2
- J.H. Stathis
- D.J. Dimaria
- 1992
- Applied Physics Letters
Degradation and breakdown of silicon dioxide films on silicon
- D.J. Dimaria
- D. Arnold
- et al.
- 1992
- Applied Physics Letters
Thin-oxide dual-electron-injector annealing studies using conductivity and electron energy-loss spectroscopy
- L. Dori
- J. Bruley
- et al.
- 1991
- Journal of Applied Physics
Trapping and trap creation studies on nitrided and reoxidized-nitrided silicon dioxide films on silicon
- D.J. DiMaria
- J.H. Stathis
- 1991
- Journal of Applied Physics
Coulombic and neutral trapping centers in silicon dioxide
- D.A. Buchanan
- M.V. Fischetti
- et al.
- 1991
- Physical Review B
Interface and bulk trap generation in metal-oxide-semiconductor capacitors
- D.A. Buchanan
- D.J. DiMaria
- 1990
- Journal of Applied Physics
Temperature dependence of trap creation in silicon dioxide
- D.J. DiMaria
- 1990
- Journal of Applied Physics
Trap creation in silicon dioxide produced by hot electrons
- D.J. DiMaria
- J.W. Stasiak
- 1989
- Journal of Applied Physics
Coulombic and neutral electron trapping centers in SiO2
- D.A. Buchanan
- M.V. Fischetti
- et al.
- 1989
- Applied Surface Science