The measurement of effective complex refractive indices for selected metal silicides
- R.D. Frampton
- E.A. Irene
- et al.
- 1986
- Journal of Applied Physics
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32 results for E.A. Irene
Rate of formation of silicon dioxide; Semiconducting ruthenium silicide
- F.M. D'Heurle
- R.D. Frampton
- et al.
- 1985
- Applied Physics Letters
Observation of defects in mercury cadmium telluride crystals grown by chemical vapor transport
- E.A. Irene
- E. Tierney
- et al.
- 1983
- Applied Physics Letters
Oxidation of silicide thin films: TiSi2
- F.M. D'Heurle
- E.A. Irene
- et al.
- 1983
- Applied Physics Letters
Silicon oxidation studies: A revised model for thermal oxidation
- E.A. Irene
- 1983
- Journal of Applied Physics
Evidence for a parallel path oxidation mechanism at the Si-SiO2 interface
- E.A. Irene
- 1982
- Applied Physics Letters
Tantalum silicide films deposited by dc sputtering
- J. Angilello
- J.E.E. Baglin
- et al.
- 1981
- Journal of Electronic Materials
WP-A7 Some Physical Properties of Dry High-Pressure Oxide Films on Silicon
- Robert J. Zeto
- E.A. Irene
- et al.
- 1978
- IEEE T-ED
Residual stress in silicon nitride films
- E.A. Irene
- 1976
- Journal of Electronic Materials
Some properties of chemically vapor deposited films of AlxOyNz on silicon
- E.A. Irene
- V.J. Silvestri
- et al.
- 1975
- Journal of Electronic Materials