Characterization of mev ion-implanted gainas/gaas using x-ray and raman techniques
- Chu R. Wie
- K. Xie
- et al.
- 1989
- Proceedings of SPIE 1989
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233 results at Proceedings of SPIE 1989
Electron spin resonance spectroscopy of defects in low temperature dielectric films
- D. Jousse
- Jerzy Kanicki
- et al.
- 1989
- Proceedings of SPIE 1989
Identifying metal surfaces in color images
- Glenn Healey
- W.E. Blanz
- 1989
- Proceedings of SPIE 1989
Some history and technology of scanning microscopy
- H.K. Wickramasinghe
- 1989
- Proceedings of SPIE 1989
Creating and observing surface features with a scanning tunneling microscope.
- J. Schneir
- P.K. Hansma
- et al.
- 1989
- Proceedings of SPIE 1989
High-Resolution Capacitance Measurement By Force Microscopy: Application To Sample Characterization And Potentiometry
- David W. Abraham
- Yves Martin
- et al.
- 1989
- Proceedings of SPIE 1989
Scanning Near-Field Optical Microscopy (SNOM*): Basic Principles and Some Recent Developments
- U.C. Fischer
- U. Dürig
- 1989
- Proceedings of SPIE 1989
Atomic force microscope: Implementations
- P.C.D. Hobbs
- Y. Martin
- et al.
- 1989
- Proceedings of SPIE 1989
The psychophysics of spatial sampling
- Bernice E. Rogowitz
- 1989
- Proceedings of SPIE 1989
A topological perspective on the structure of images
- A. Peter Blicher
- 1989
- Proceedings of SPIE 1989