Noble metal suicide formation in metal/Si structures during oxygen annealing: Implications for perovskite-based memory devices
- K.L. Saenger
- A. Grill
- et al.
- 1998
- Journal of Materials Research
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Lowering the formation temperature of the C54-TiSi2 phase using a metallic interfacial layer
- C. Cabral Jr.
- L. Clevenger
- et al.
- 1997
- Journal of Materials Research
The stability of Si1-xGex strained layers on small-area trench-isolated silicon
- K. Schonenberg
- Siu-Wai Chan
- et al.
- 1997
- Journal of Materials Research
Contact area evolution during an indentation process
- Kangjie Li
- T.W. Wu
- et al.
- 1997
- Journal of Materials Research
Origin of the φ ∼ ±9° peaks in YBa2Cu3O7-δ films grown on cubic zirconia substrates
- D.G. Schlom
- E.S. Hellman
- et al.
- 1996
- Journal of Materials Research
Analysis of the diffusion controlled growth of cobalt suicides in bulk and thin film couples
- T. Barge
- P. Gas
- 1995
- Journal of Materials Research
A comparison of C54-TiSi2 formation in blanket and submicron gate structures using in situ x-ray diffraction during rapid thermal annealing
- J. Bucchignano
- G.B. Stephenson
- et al.
- 1995
- Journal of Materials Research
Glass formation from low molecular weight organic melts
- Seong-Jin Kim
- Tom Karis
- 1995
- Journal of Materials Research
Amorphous carbon antireflective coatings in the 10 to 50 fxm region of the far-IR
- Serhat Mefin
- James H. Kaufman
- et al.
- 1994
- Journal of Materials Research
Atomic scale oxide superlattices grown by RHEED controlled pulsed laser deposition
- T.M. shaw
- A. Gupta
- et al.
- 1994
- Journal of Materials Research