Electromigration-induced stress in aluminum conductor lines measured by x-ray microdiffraction
- P.-C. Wang
- G.S. Cargill
- et al.
- 1998
- Applied Physics Letters
Publications
2351 results at Applied Physics Letters
Fabrication and properties of heteroepitaxial magnetite (Fe3O4) tunnel junctions
- X.W. Li
- A. Gupta
- et al.
- 1998
- Applied Physics Letters
X-ray diffraction analysis of SiGe/Si heterostructures on sapphire substrates
- P.M. Mooney
- J.A. Ott
- et al.
- 1998
- Applied Physics Letters
Light-coupling masks for lensless, sub-wavelength optical lithography
- Heinz Schmid
- Hans Biebuyck
- et al.
- 1998
- Applied Physics Letters
Decoupling the structural and magnetic phase transformations in magneto-optic MnBi thin films by the partial substitution of Cr for Mn
- Prabhakar R. Bandaru
- Timothy D. Sands
- et al.
- 1998
- Applied Physics Letters
Temperature and bias dependence of magnetoresistance in doped manganite thin film trilayer junctions
- J.Z. Sun
- D.W. Abraham
- et al.
- 1998
- Applied Physics Letters
Photothermal displacement measurement of transient melting and surface deformation during pulsed laser heating
- Shaochen Chen
- Costas P. Grigoropoulos
- et al.
- 1998
- Applied Physics Letters
Linewidth and underlayer influence on texture in submicrometer-wide Al and AlCu lines
- J.L. Hurd
- K.P. Rodbell
- et al.
- 1998
- Applied Physics Letters
Silicon di-interstitial in ion-implanted silicon
- Young Hoon Lee
- 1998
- Applied Physics Letters
Local modification of magnetic properties by an electron beam
- R. Allenspach
- A. Bischof
- et al.
- 1998
- Applied Physics Letters