Determination of processing damage in thin polycrystalline Ir films using Bragg-peak fringe analysis
- K.L. Saenger
- I.C. Noyan
- 2001
- Journal of Applied Physics
Publications
2360 results at Journal of Applied Physics
Texture transformations in reactive metal films deposited upon amorphous substrates
- D. Dunn
- R. Hull
- et al.
- 2001
- Journal of Applied Physics
Hydrogen induced tunnel emission in Pt/(BaxSr1-x)Ti1+yO3+z/Pt thin film capacitors
- J.D. Baniecki
- R.B. Laibowitz
- et al.
- 2001
- Journal of Applied Physics
Electromigration of copper in Al(0.25 at.% Cu) conductor lines
- H.K. Kao
- G.S. Cargill III
- et al.
- 2001
- Journal of Applied Physics
Texture inheritance in Al(Cu) interconnect materials
- C.E. Murray
- K.P. Rodbell
- 2001
- Journal of Applied Physics
Gate tunneling currents in ultrathin oxide metal-oxide-silicon transistors
- Jin Cai
- Chih-Tang Sah
- 2001
- Journal of Applied Physics
Influence of trapped and interfacial charges in organic multilayer light-emitting devices
- W. Brütting
- H. Riel
- et al.
- 2001
- Journal of Applied Physics
Long-range Coulomb interactions in small Si devices. Part II. Effective electron mobility in thin-oxide structures
- M.V. Fischetti
- 2001
- Journal of Applied Physics
Self-propagating exothermic reactions between silicon and transition metals of groups IVA-VIA induced by mechanical alloying
- Bing K. Yen
- 2001
- Journal of Applied Physics
Long-range Coulomb interactions in small Si devices. Part I: Performance and reliability
- M.V. Fischetti
- S.E. Laux
- 2001
- Journal of Applied Physics