Structural and optical verification of residual strain effect in single crystalline CdTe nanowires
- Liubing Huang
- Siyuan Lu
- et al.
- 2013
- Nano Research
Publications
14338 results for Physical Sciences
Electronic properties of Mn-decorated silicene on hexagonal boron nitride
- T.P. Kaloni
- S. Gangopadhyay
- et al.
- 2013
- Physical Review B - CMMP
Fluorocarbon assisted atomic layer etching of SiO2 using cyclic Ar/C4F8 plasma
- Dominik Metzler
- Robert L. Bruce
- et al.
- 2013
- JVSTA
Defects on high resolution negative-tone resist The revenge of the blobs
- M.I. Sanchez
- L.K. Sundberg
- et al.
- 2013
- SPIE Photomask Technology + EUV Lithography 2013
Two-dimensional mask effects at the 14 nm logic node
- A.E. Zweber
- A.E. McGuire
- et al.
- 2013
- SPIE Photomask Technology 2013
Integration of GaAs on Ge/Si towers by MOVPE
- A.G. Taboada
- T. Kreiliger
- et al.
- 2013
- MRS Spring Meeting 2013
Your worst Nightmare - Inspection of aggressive OPC on 14 nm masks with emphasis on defect sensitivity and wafer defect print predictability
- Karen D. Badger
- Michael Hibbs
- et al.
- 2013
- SPIE Photomask Technology 2013
Measurements of light absorption efficiency in InSb nanowires
- A. Jurgilaitis
- H. Enquist
- et al.
- 2013
- Structural Dynamics
Bubble and pattern formation in liquid induced by an electron beam
- Joseph M. Grogan
- Nicholas M. Schneider
- et al.
- 2013
- Nano Letters
Thermal probe nanolithography: In-situ inspection, high-speed, high-resolution, 3D
- Felix Holzner
- Philip Paul
- et al.
- 2013
- EMLC 2013