RIDDLE: A Foundation for Test Generation on a High-Level Design DescriptionIlan Spillinger1991IEEE TC
Functional Fault Simulation as a Guide for Biased-Random Test Pattern GenerationIlan Spillinger1991IEEE TC
Efficient Algorithms for Reconfiguration in VLSI/WSI ArraysVwani P. RoychowdhuryJehoshua Brucket al.1990IEEE TC
Algorithm-Based Fault Tolerance on a Hypercube MultiprocessorPrithviraj BanerjeeJoe T. Rahmehet al.1990IEEE TC