Topographic patterning by voltage-assisted tribocharging of a polymer
- A. Kleiner
- O. Marti
- et al.
- 2011
- Journal of Applied Physics
Publications
2360 results at Journal of Applied Physics
Kinetics of nickel silicide growth in silicon nanowires: From linear to square root growth
- Y.E. Yaish
- A. Katsman
- et al.
- 2011
- Journal of Applied Physics
Nanoscale silicon-on-insulator deformation induced by stressed liner structures
- Conal E. Murray
- Andrew Ying
- et al.
- 2011
- Journal of Applied Physics
High temperature annealing stability of magnetic properties in MgO-based perpendicular magnetic tunnel junction stacks with CoFeB polarizing layer
- M. Tofizur Rahman
- Andrew Lyle
- et al.
- 2011
- Journal of Applied Physics
Capacitance-voltage and deep-level-transient spectroscopy characterization of defects near SiO2/SiC interfaces
- A.F. Basile
- John Rozen
- et al.
- 2011
- Journal of Applied Physics
X-ray photoelectron spectroscopy study on Fe and Co catalysts during the first stages of ethanol chemical vapor deposition for single-walled carbon nanotube growth
- Satoshi Oida
- Fenton R. McFeely
- et al.
- 2011
- Journal of Applied Physics
Characterizing the effects of etch-induced material modification on the crystallization properties of nitrogen doped Ge2Sb2Te 5
- J.S. Washington
- Eric A. Joseph
- et al.
- 2011
- Journal of Applied Physics
The effect of interface processing on the distribution of interfacial defect states and the C-V characteristics of III-V metal-oxide-semiconductor field effect transistors
- Cheng-Wei Cheng
- George Apostolopoulos
- et al.
- 2011
- Journal of Applied Physics
A quantitative analysis of room temperature recrystallization kinetics in electroplated copper films using high resolution x-ray diffraction
- Andrew Ying
- Christian Witt
- et al.
- 2011
- Journal of Applied Physics
Determination of band offsets, chemical bonding, and microstructure of the (TbxSc1-x) 2 O3 /Si system
- I. Geppert
- M. Eizenberg
- et al.
- 2010
- Journal of Applied Physics