Silsesquioxane-based 193 nm bilayer resists: Characterization and lithographic evaluation
- Hiroshi Ito
- Hoa D. Truong
- et al.
- 2005
- Microlithography 2005
Publications
1959 results for Impact Science
The IHE-Bus: A practical tool to instrument and simulate IHE deployment
- Uri Shani
- Boaz Carmeli
- et al.
- 2005
- SPIE Medical Imaging 2005
Biological chiral recognition: The substrate's perspective
- Vidyasankar Sundaresan
- Ravinder Abrol
- 2005
- Chirality
An estimator of number of species from quadrat sampling
- Peter J. Haas
- Yushan Liu
- et al.
- 2005
- Biometrics
Enhancing the accuracy of virtual screening: Molecular dynamics with quantum-refined force fields
- Alessandro Curioni
- Tiziana Mordasini
- et al.
- 2005
- J. Comput. Aided Mol. Des.
Spatially transient stress effects in thin films by X-ray diffraction
- C.E. Murray
- C.C. Goldsmith
- et al.
- 2005
- Powder Diffraction
A recursive un-termination method for nondestructive in situ S-parameter measurement of hermetically encapsulated packages
- Ullrich R. Pfeiffer
- Christian Schuster
- 2005
- IEEE T-MTT
No immediate pain relief for the pharmaceutical industry
- Heather Ahlborn
- Stuart Henderson
- et al.
- 2005
- Current Opinion in Drug Discovery and Development
Reactive diffusion in the Ni-Si system: Phase sequence and formation of metal-rich phases
- C. Lavoie
- C. Coia
- et al.
- 2004
- DIMAT 2004
Stress development during the reactive formation of silicide films
- Olivier Thomas
- Patrice Gergaud
- et al.
- 2004
- DIMAT 2004