In situ analysis of the formation of thin TiSi2 (<50 nm) contacts in submicron CMOS structures during rapid thermal annealing
- L. Clevenger
- C. Cabral Jr.
- et al.
- 1995
- MRS Fall Meeting 1995
Publications
3512 results for Materials Discovery
Theoretical considerations about phase growth and phase formation
- F.M. D'Heurle
- 1995
- MRS Fall Meeting 1995
Solvent, LiCl, and temperature effects on the morphological structure and electronic properties of polyaniline
- Marie Angelopoulos
- Yun-Hsin Liao
- et al.
- 1995
- MRS Fall Meeting 1995
Focused ion beam metrology
- A. Wagner
- P.G. Blauner
- et al.
- 1995
- MRS Fall Meeting 1995
New single source precursor approach to gallium and aluminum nitride
- D. Neumayer
- C.J. Carmalt
- et al.
- 1995
- MRS Fall Meeting 1995
Properties of Zn implanted GaN
- S. Strite
- P.W. Epperlein
- et al.
- 1995
- MRS Fall Meeting 1995
High conductivity FIB deposited metal
- P.G. Blauner
- A. Wagner
- 1995
- MRS Fall Meeting 1995
Si(001) homoepitaxial growth
- R.M. Tromp
- W. Theis
- et al.
- 1995
- MRS Fall Meeting 1995
Adhesion and friction properties of hydrogenated amorphous carbon films measured by atomic force microscopy
- Scott S. Perry
- Gabor A. Somorjai
- et al.
- 1995
- Tribology Letters
Surface diffusion and flow activation energies of perfluoropolyalkylether
- Teresa M. O'Connor
- Myung S. Jhon
- et al.
- 1995
- Tribology Letters