Optical surface analysis of the head-disk-interface of thin film disks
- Steven W. Meeks
- Walter E. Weresin
- et al.
- 1995
- Journal of Tribology
Publications
3512 results for Materials Discovery
A comparison of C54-TiSi2 formation in blanket and submicron gate structures using in situ x-ray diffraction during rapid thermal annealing
- J. Bucchignano
- G.B. Stephenson
- et al.
- 1995
- Journal of Materials Research
Substrate temperature effects on the electrical properties of CdS films prepared by chemical spray pyrolysis
- Steve Pence
- Elizabeth Varner
- et al.
- 1995
- Materials Letters
Use of high temperature and high humidity to test the adhesion of sputtered copper to a polyimide surface modified by an ac nitrogen glow discharge
- J.B. Ma
- J. Dragon
- et al.
- 1995
- Journal of Adhesion Science and Technology
Electrical transport properties of hot electrons at metal, insulator, and semiconductor interfaces
- R. Ludeke
- A. Bauer
- 1995
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Information depth in EELS of an organic solid
- R.J. Purtell
- M. Pomerantz
- et al.
- 1994
- Surface Science
Thermal stability of silicide on polycrystalline Si
- Q.Z. Hong
- Stella Q. Hong
- et al.
- 1994
- Thin Solid Films
Monte Carlo investigation of head-tail ordering of CO monolayers on graphite
- D. Marx
- S. Sengupta
- et al.
- 1994
- Surface Science
Si ALE using chlorine/hydrogen exchange. Fundamentals and films
- D.D. Koleske
- S. Gates
- 1994
- Applied Surface Science
Defects in heterogeneous solids - from microphysics to macrophysics
- S.T. Pantelides
- D. Maroudas
- et al.
- 1993
- ICDS 1993