Trap creation in silicon dioxide produced by hot electrons
- D.J. DiMaria
- J.W. Stasiak
- 1989
- Journal of Applied Physics
Publications
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.
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2353 results at Journal of Applied Physics
Thermal stability of the Cu/PtSi metallurgy
- Chin-An Chang
- 1989
- Journal of Applied Physics
Stability of electrical properties of nitrogen-rich, silicon-rich, and stoichiometric silicon nitride films
- W.S. Lau
- S.J. Fonash
- et al.
- 1989
- Journal of Applied Physics
Processing effects on the tribological characteristics of reactively sputtered chromium oxide (Cr2O3) overcoat films
- A.S. Kao
- M.F. Doerner
- et al.
- 1989
- Journal of Applied Physics
Interfacial roughness in InAs/GaAs heterostructures determined by soft x-ray reflectivity
- S.C. Woronick
- B.X. Yang
- et al.
- 1989
- Journal of Applied Physics
Formation of PtSi in the presence of Al and a Cr barrier layer
- Chin-An Chang
- 1989
- Journal of Applied Physics
High-temperature interaction studies of C/Cu/SiO2/Si and related structures
- Chin-An Chang
- 1989
- Journal of Applied Physics
Pin-on-disk tribology of thin-film magnetic recording disks
- Tom Karis
- V. Novotny
- 1989
- Journal of Applied Physics
Measurements of carbon thin films using x-ray reflectivity
- Michael F. Toney
- Sean Brennan
- 1989
- Journal of Applied Physics
High-resolution surface charge measurements on an organic photoconductor
- E.J. Yarmchuk
- G.E. Keefe
- 1989
- Journal of Applied Physics