Elemental and electronic characterization of semiconductor materials with the STEM
- P.E. Batson
- 1989
- Proceedings of SPIE 1989
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233 results at Proceedings of SPIE 1989
Characterization of semiconductor silicon by transmission electron microscopy
- Teh Y. Tan
- 1989
- Proceedings of SPIE 1989
Performance of multilayer dispersion elements from 80 to 500 ev
- R.J. Bartlett
- D.R. Kania
- et al.
- 1989
- Proceedings of SPIE 1989
Scanning soft x-ray microscopy with a fresnel zoneplate at the national synchrotron light source
- John M. Kenney
- Janos Kirz
- et al.
- 1989
- Proceedings of SPIE 1989
Electron beam fabrication and characterization of fresnel zone plates for soft x-ray microscopy
- D. Kern
- P. Coane
- et al.
- 1989
- Proceedings of SPIE 1989
On the possibility of measuring the diffraction pattern of single micro objects
- D. Sayre
- R.P. Haelbich
- et al.
- 1989
- Proceedings of SPIE 1989
Possibilities for the study of blood platelets using soft x-ray microscopy
- Mario G. Baldini
- B.K. Kim
- et al.
- 1989
- Proceedings of SPIE 1989
Optimization of the optics matching a storage ring to an X-ray lithography camera
- Rolf P. Haelbich
- 1989
- Proceedings of SPIE 1989
Fabrication of free-standing x-ray transmission gratings and zone plates
- Y. Vladimirsky
- E. Kallne
- et al.
- 1989
- Proceedings of SPIE 1989
Electron beam pattern writer for x-ray masks
- R. Viswanathan
- A.D. Wilson
- et al.
- 1989
- Proceedings of SPIE 1989