Preparation and properties of resistive films
- K.K. Shih
- A. Aviram
- et al.
- 1988
- Thin Solid Films
Publications
3509 results for Materials Discovery
Capacitance-voltage properties of thin Ta2O5 films on silicon
- Gottlieb S. Oehrlein
- 1988
- Thin Solid Films
Effect of excess silicon on behavior of LPCVD WSix films on silicon
- R.V. Joshi
- Young H. Kim
- et al.
- 1988
- Thin Solid Films
Atomic structure and bonding of Si(111)-(V3 x v 3)AI
- R.J. Hamers
- J.E. Demuth
- 1988
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Atomic force microscopy using optical interferometry
- R. Erlandsson
- G.M. Mcclelland
- et al.
- 1988
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Thin film adhesion: New possibilities for interface engineering
- J.E.E. Baglin
- 1988
- Materials Science and Engineering B
The effects of inhibitors and contaminants on the stability of magnetic tape lubricants
- E.E. Klaus
- B. Bhushan
- 1988
- Tribology Transactions
Tungsten-rhenium alloys as diffusion barriers between aluminum and silicon
- S.-E. Hörnström
- T. Lin
- et al.
- 1988
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Comparison between amorphous Ni-Zr alloys formed by solid state reaction and by codeposition
- G.V. Chandrashekhar
- D. Gupta
- et al.
- 1988
- Thin Solid Films
Study of electric field effects on the electronic structure of quantum wells by resonant Raman scattering
- J.M. Calleja
- C. López
- et al.
- 1988
- Surface Science