Materials and scaling effects on on-chip interconnect reliability
- C.-K. Hu
- E. Liniger
- et al.
- 2013
- MRS Spring Meeting 2013
Publications
Date
Featured collections
Popular topics
24092 results for Exploratory Science
Reducing density-induced CMP non-uniformity for advanced semiconductor technology nodes
- John H. Zhang
- Wei-Tsu Tseng
- et al.
- 2013
- MRS Spring Meeting 2013
Electromigration extendibility of Cu(Mn) alloy-seed interconnects, and understanding the fundamentals
- Takeshi Nogami
- C. Penny
- et al.
- 2012
- IEDM 2012
Managing data-movement for effective shared-memory parallelization of out-of-core sparse solvers
- Haim Avron
- Anshul Gupta
- 2012
- SC 2012
InAs-Si heterojunction nanowire tunnel diodes and tunnel FETs
- Heike Riel
- K. Moselund
- et al.
- 2012
- IEDM 2012
Scalable and fully self-aligned n-type carbon nanotube transistors with gate-all-around
- Aaron D. Franklin
- Siyuranga O. Koswatta
- et al.
- 2012
- IEDM 2012
Statistical measurement of random telegraph noise and its impact in scaled-down high-κ/metal-gate MOSFETs
- H. Miki
- N. Tega
- et al.
- 2012
- IEDM 2012
Application data prefetching on the IBM blue gene/Q supercomputer
- I.-Hsin Chung
- Changhoan Kim
- et al.
- 2012
- SC 2012
Critical lock analysis: Diagnosing critical section bottlenecks in multithreaded applications
- Guancheng Chen
- Per Stenstrom
- 2012
- SC 2012
22nm High-performance SOI technology featuring dual-embedded stressors, Epi-Plate High-K deep-trench embedded DRAM and self-aligned Via 15LM BEOL
- S. Narasimha
- P. Chang
- et al.
- 2012
- IEDM 2012