Rotational polarization in NO scattering from Ag(111)
- A.W. Kleyn
- A.C. Luntz
- et al.
- 1985
- Surface Science
Publications
3509 results for Materials Discovery
Summary Abstract: Raman scattering at buried semiconductor-metal interfaces
- J.C. Tsang
- 1985
- JVSTA
Thin films for optical data storage
- Wen-yaung Lee
- 1985
- JVSTA
Summary Abstract: Modification of metals by low energy ions during thin film deposition
- J.M.E. Haroer
- J.J. Cuomo
- 1985
- JVSTA
Summary Abstract: Investigation of the interface chemistry of titanium-tungsten Schottky barrier contacts to silicon by Auger spectroscopy
- J.E. Lewis
- M.O. Aboelfotoh
- et al.
- 1985
- JVSTA
Chemical reactions at Pt/oxide/Si and Ti/oxide/Si interfaces
- M. Liehr
- F.K. LeGoues
- et al.
- 1985
- JVSTA
Coverage of Si substrates by self-assembling monolayers and multilayers as measured by IR, wettability and X-ray diffraction
- M. Pomerantz
- A. Segmüller
- et al.
- 1985
- Thin Solid Films
Summary Abstract: The interaction mechanism of inelastic electron tunneling spectroscopy probed by high resolution electron energy loss spectroscopy
- M. Liehr
- P.A. Thiry
- et al.
- 1985
- JVSTA
Reactive sputtering of copper and silicon near the sputtering threshold
- T.M. Mayer
- J.M.E. Harper
- et al.
- 1985
- JVSTA
Superlattice effects in acceptor GICs
- G. Campagnoli
- E. Tosatti
- 1985
- Synthetic Metals