Base electrodes for high dielectric constant oxide materials in silicon technology
- A. Grill
- W. Kane
- et al.
- 2011
- Journal of Materials Research
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113 results at Journal of Materials Research
Surface, Interface, And Thin-Film Magnetism
- L.M. Falicov
- Daniel T. Pierce
- et al.
- 2011
- Journal of Materials Research
Thin-film interactions and their relevance to electronic packaging
- Chin-An Chang
- 2011
- Journal of Materials Research
Properties and microstructure of tungsten films deposited by ion-assisted evaporation
- R.A. Roy
- R. Petkie
- et al.
- 2011
- Journal of Materials Research
Microscratch and load relaxation tests for ultra-thin films
- T.W. Wu
- 2011
- Journal of Materials Research
The effect of lateral crack growth on the strength of contact flaws in brittle materials
- Robert F. Cook
- David H. Roach
- 2011
- Journal of Materials Research
Crack resistance by interfacial bridging: Its role in determining strength characteristics
- Yiu-Wing Mai
- Brian R. Lawn
- 2011
- Journal of Materials Research
Stress and thermal expansion of β-SiC films by the vibrating-membrane method
- B.S. Berry
- W.C. Pritchet
- et al.
- 2011
- Journal of Materials Research
Sol-gel route to high Tc ceramic precursors
- Tom Karis
- J. Economy
- 2011
- Journal of Materials Research
Quantitative Investigation of Titanium/Amorphous-Silicon Multilayer Thin Film Reactions
- K.N. Tu
- L. Clevenger
- et al.
- 2011
- Journal of Materials Research