Submicron mapping of silicon-on-insulator strain distributions induced by stressed liner structures
- Conal E. Murray
- K.L. Saenger
- et al.
- 2008
- Journal of Applied Physics
Publications
2360 results at Journal of Applied Physics
Parallel silicide contacts
- I. Ohdomari
- K.N. Tu
- 2008
- Journal of Applied Physics
X-ray photoelectron spectroscopy and Auger electron spectroscopy studies of glow discharge Si1-xCx:H films
- Wen-Yaung Lee
- 2008
- Journal of Applied Physics
Measurements of device parameters on large arrays of Josephson interferometers
- S. Basavaiah
- J.H. Greiner
- et al.
- 2008
- Journal of Applied Physics
All-Nb low-noise dc SQUID with 1-μm tunnel junctions
- Richard F. Voss
- Robert B. Laibowitz
- et al.
- 2008
- Journal of Applied Physics
Electron spectroscopy study of silicon surfaces exposed to XeF2 and the chemisorption of SiF4 on silicon
- T.J. Chuang
- 2008
- Journal of Applied Physics
Thickness dependence of the photoconductivity of phosphorus-doped hydrogenated amorphous silicon
- I. Solomon
- M.H. Brodsky
- 2008
- Journal of Applied Physics
A method for increasing the etch-rate ratio of oxides to nonoxides in inert-gas ion milling processes
- U. Gerlach-Meyer
- J.W. Coburn
- et al.
- 2008
- Journal of Applied Physics
Growth and dissolution kinetics of III-V heterostructures formed by LPE. II. Comparison between thermodynamic and kinetic models
- M.B. Small
- R. Ghez
- 2008
- Journal of Applied Physics
The implication of flow-rate dependencies in plasma etching
- B.N. Chapman
- T.A. Hansen
- et al.
- 2008
- Journal of Applied Physics