Quantum dots and etch-induced depletion of a silicon two-dimensional electron gas
- L.J. Klein
- K.L.M. Lewis
- et al.
- 2006
- Journal of Applied Physics
Publications
2360 results at Journal of Applied Physics
Dielectric breakdown mechanisms in gate oxides
- Salvatore Lombardo
- James H. Stathis
- et al.
- 2005
- Journal of Applied Physics
Effect of metal liner on electromigration in Cu Damascene lines
- C.-K. Hu
- L. Gignac
- et al.
- 2005
- Journal of Applied Physics
Simple model for time-dependent dielectric breakdown in inter- and intralevel low- k dielectrics
- J.R. Lloyd
- E. Liniger
- et al.
- 2005
- Journal of Applied Physics
Operation and properties of ambipolar organic field-effect transistors
- G. Paasch
- Th. Lindner
- et al.
- 2005
- Journal of Applied Physics
Limits of strain relaxation in InGa/AsGaAs probed in real time by in situ wafer curvature measurement
- C. Lynch
- E. Chason
- et al.
- 2005
- Journal of Applied Physics
Hydrogen plasma effects on ultralow-k porous SiCOH dielectrics
- A. Grill
- V. Sternhagen
- et al.
- 2005
- Journal of Applied Physics
Fundamentals of micromechanical thermoelectric sensors
- U. Dürig
- 2005
- Journal of Applied Physics
High-temperature degradation of NiSi films: Agglomeration versus NiSi 2 nucleation
- D. Deduytsche
- C. Detavernier
- et al.
- 2005
- Journal of Applied Physics
On the relationship of magnetocrystalline anisotropy and stoichiometry in epitaxial L1 0 CoPt (001) and FePt (001) thin films
- K. Barmak
- J. Kim
- et al.
- 2005
- Journal of Applied Physics