Secondary Ion Emission and Sputter Yields from Metal Targets under F2+Bombardment
- Wilhad Reuter
- J.G. Clabes
- 2002
- Analytical Chemistry
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Spatially Resolved Laser Transfer of Organic Surface Films for Infrared Analysis
- M.S. de Vries
- H.E. Hunziker
- et al.
- 2002
- Analytical Chemistry
Time-of-Flight Secondary Ion Mass Spectrometry of Perfluorinated Polyethers
- Ioannis V. Bletsos
- David M. Hercules
- et al.
- 2002
- Analytical Chemistry
Determination of Molecular Weight and Composition of a Perfluorinated Polymer from Fragment Intensities in Time-of-Flight Secondary Ion Mass Spectrometry
- David E. Fowler
- Robert D. Johnson
- et al.
- 2002
- Analytical Chemistry
Application of a CF3+Primary Ion Source for Depth Profiling in Secondary Ion Mass Spectrometry
- Wilhad Reuter
- Gerald J. Scilla
- 2002
- Analytical Chemistry
Multiphoton Ionization of Laser-Desorbed Neutral Molecules in a Fourier Transform Ion Cyclotron Resonance Mass Spectrometer
- Jeffrey A. Zimmerman
- Clifford H. Watson
- et al.
- 2002
- Analytical Chemistry
Determination of the viscoelastic properties of polymer films using a compensated phase-locked oscillator circuit
- S.-W. Lee
- W.D. Hinsberg
- et al.
- 2001
- Analytical Chemistry
Micromosaic immunoassays
- A. Bernard
- Bruno Michel
- et al.
- 2000
- Analytical Chemistry
Characterization by atomic force microscopy of fused-silica capillaries chemically modified for capillary electrokinetic chromatography
- P. Edward Pullen
- Joseph J. Pesek
- et al.
- 2000
- Analytical Chemistry
Surface characterization
- G.E. McGuire
- J. Fuchs
- et al.
- 1999
- Analytical Chemistry