Simultaneous measurement of optical properties and geometry of resist using multiple scatterometry gratings
- Alok Vaid
- Matthew Sendelbach
- et al.
- 2010
- SPIE Advanced Lithography 2010
Publications
3560 results for Mathematical Sciences
Stabilizer subsystem codes with spatially local generators
- Sergey Bravyi
- 2010
- ITW 2010
Quantum channel capacities
- Graeme Smith
- 2010
- ITW 2010
Resist-based polarization monitoring with phase-shift masks at 1.35 numerical aperture: Tool-to-tool comparison
- Gregory McIntyre
- Richard Tu
- et al.
- 2010
- SPIE Advanced Lithography 2010
Sparse Markov Net learning with priors on regularization parameters
- Katya Scheinberg
- Irina Rish
- et al.
- 2010
- ISAIM 2010
CD-SEM metrology of spike detection on sub-40 nm contact holes
- Yoshinori Momonoi
- Taro Osabe
- et al.
- 2010
- SPIE Advanced Lithography 2010
Spatial signature in local overlay measurements - "what CD-SEM can tell us and optical measurements can not"
- Scott Halle
- Daniel Moore
- et al.
- 2010
- SPIE Advanced Lithography 2010
3D-AFM enhancement for CD metrology dedicated to lithography sub-28-nm node requirements
- Johann Foucher
- Narender Rana
- et al.
- 2010
- SPIE Advanced Lithography 2010
Smooth projective hashing and two-message oblivious transfer
- Shai Halevi
- Yael Tauman Kalai
- 2010
- Journal of Cryptology
New tools and methodology for advanced parametric and defect structure test
- Raphael Robertazzi
- Louis Medina
- et al.
- 2010
- IEEE ITC 2010