Publications

9071 results for Computer Science

Characterization of semiconductor silicon by transmission electron microscopy
- - Teh Y. Tan
- 1989
- Proceedings of SPIE 1989
Elemental and electronic characterization of semiconductor materials with the STEM
- - P.E. Batson
- 1989
- Proceedings of SPIE 1989
Nuclear profiling of aluminum in GaAlAs/GaAs heterostructures
- - A. Bond
  - P. Parayanthal
  - et al.
- 1983
- Cambridge Symposium 1983
Performance analysis of checkpointing strategies
- - Asser N. Tantawi
  - Manfred Ruschitzka
- 1984
- ACM Transactions on Computer Systems (TOCS)
Highly Available Systems for Database Applications
- - Won Kim
- 1984
- ACM Computing Surveys (CSUR)
Performance of multilayer dispersion elements from 80 to 500 ev
- - R.J. Bartlett
  - D.R. Kania
  - et al.
- 1989
- Proceedings of SPIE 1989
Electron beam fabrication and characterization of fresnel zone plates for soft x-ray microscopy
- - D. Kern
  - P. Coane
  - et al.
- 1989
- Proceedings of SPIE 1989
On the possibility of measuring the diffraction pattern of single micro objects
- - D. Sayre
  - R.P. Haelbich
  - et al.
- 1989
- Proceedings of SPIE 1989
Scanning soft x-ray microscopy with a fresnel zoneplate at the national synchrotron light source
- - John M. Kenney
  - Janos Kirz
  - et al.
- 1989
- Proceedings of SPIE 1989
Possibilities for the study of blood platelets using soft x-ray microscopy
- - Mario G. Baldini
  - B.K. Kim
  - et al.
- 1989
- Proceedings of SPIE 1989